Built-In Self-Test for Static ADC Testing with a Triangle-Wave

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概要

• 論文の詳細を見る

• This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

著者

• Kang Sungho

  Yonsei University

• KIM Incheol

  Yonsei University

• LEE Ingeol

  Yonsei University

関連論文

• Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
• Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
• Built-In Self-Test for Static ADC Testing with a Triangle-Wave

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