WANG Dong | Art, Science and Technology Center for Cooperative Research, Kyushu University

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著作論文

Passivation of Electrically Active Defects in Ge-Rich SiGe-on-Insulator by Al_2O_3 Deposition and Subsequent Post-Deposition Annealing
Low-Temperature Growth of Thin Silicon Nitride Film by Electron Cyclotron Resonance Plasma Irradiation
Method for Detecting Defects in Silicon-On-Insulator Using Capacitance Transient Spectroscopy
Fabrication of Ge Metal--Oxide--Semiconductor Capacitors with High-Quality Interface by Ultrathin SiO2/GeO2 Bilayer Passivation and Postmetallization Annealing Effect of Al
Photoluminescence characterization of strained Si-SiGe-on-insulator wafers
Electrical Characterization of Strained Si/SiGe Wafers using Transient Capacitance Measurements
Measurement of Strain in Freestanding Si/SixNy Membrane by Convergent Beam Electron Diffraction and Finite Element Method
High-Performance Ge Metal-Oxide-Semiconductor Field-Effect Transistors with a Gate Stack Fabricated by Ultrathin SiO_2/GeO_2 Bilayer Passivation
Role of Heavily B-doped Layer on Low-Temperature Fe Gettering in Bifacial Si Solar Cell Fabrication
Fe Gettering for High-Efficiency Solar Cell Fabrication
Schottky Source/Drain Ge Metal-Oxide-Semiconductor Field-Effect Transistors with Directly Contacted TiN/Ge and HfGe/Ge Structures
Evaluation of Interface States Density and Minority Carrier Generation Lifetime for Strained Si/SiGe Wafers Using Transient Capacitance Method
Method for Detecting Defects in Silicon-On-Insulator Using Capacitance Transient Spectroscopy
Low-Temperature Growth of Thin Silicon Nitride Film by Electron Cyclotron Resonance Plasma Irradiation
Photoluminescence Characterization of Strained Si–SiGe-on-Insulator Wafers

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