NAKAMAE Masahiko | Sumitomo Mitsubishi Silicon Corporation
スポンサーリンク
概要
関連著者
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WANG Dong
Art, Science and Technology Center for Cooperative Research, Kyushu University
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NAKASHIMA Hiroshi
Art, Science and Technology Center for Cooperative Research, Kyushu University
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NINOMIYA Masaharu
Sumitomo Mitsubishi Silicon Corporation
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NAKAMAE Masahiko
Sumitomo Mitsubishi Silicon Corporation
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Wang Dong
Art Science And Technology Center For Cooperative Research Kyushu University
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Nakashima Hiroshi
Art Science And Technology Center For Cooperative Research Kyushu University
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Nakamae Masahiko
Sumco Corporation
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Ninomiya Masaharu
Sumitomo Mitsubishi Silicon Corporation, 2201 Oaza Kamioda, Kohoku-cho, Kishima-gun, Saga 849-0579, Japan
著作論文
- Electrical Characterization of Strained Si/SiGe Wafers using Transient Capacitance Measurements
- Evaluation of Interface States Density and Minority Carrier Generation Lifetime for Strained Si/SiGe Wafers Using Transient Capacitance Method