Effect of Electrical Aging on Field Electron Emission from Screen-Printed Carbon Nanotube Film
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概要
- 論文の詳細を見る
We investigated the effect of electrical aging on field electron emission from a screen-printed carbon nanotube (CNT) film. After maintaining the field-emission current density at 20 mA/cm2 for 3 h in the DC mode, it was observed that initially long CNTs became short and initially lying CNTs stood up. As a result, the field-emission uniformity and lifetime were markedly improved. From the analysis of the corresponding Fowler–Nordheim plots using a temperature-dependent formula, the shortening of CNTs by electrical aging was found to originate from the thermal evaporation of carbon atoms at the tip of CNTs during field electron emission.
- 2007-02-15
著者
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MACHIDA Hironobu
Handai Frontier Research Center (FRC)
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Kawai Hideyasu
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Himuro Katsuya
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Fujii Shunjiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Ishida Kazuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Honda Shin-ichi
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Katayama Mitsuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Oura Kenjiro
Research Center for Ultra High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Himuro Katsuya
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Kawai Hideyasu
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Honda Shin-ichi
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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