Scanning Tunneling Microscopy Profiling of Steep Ridges Using Metal-Coated Carbon Nanotube Tip

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概要

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• We demonstrated the accurate imaging of steep ridges by scanning tunneling microscopy (STM) with a carbon nanotube (CNT) tip coated with a PtIr thin layer. Compared with the conventional tungsten tip, the PtIr-coated CNT tip could trace the shape of steep ridges (140 nm in width, 50 nm in height) more precisely with reduced artifacts originating from the finite shape of the tips. We also estimated the tip radius from the line profiles in the STM image, and proved that the tunneling current exactly flowed through the apex of the PtIr-coated CNT without bending or tilting of the tip during STM.

• 2007-12-15

著者

• Murata Yuya

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Tagawa Seiichi

  The Institute Of Scientific And Industrial Research

• Kimura Takehiko

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Motoyoshi Kenji

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Matsui Yoshinori

  The Institute Of Scientific And Industrial Research Osaka University

• Kishida Masaru

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Honda Shin-ichi

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Katayama Mitsuhiro

  Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U

• Okamoto Kazumasa

  The Institute Of Scientific And Industrial Research Osaka University

• Murata Yuya

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

• Kishida Masaru

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

• Motoyoshi Kenji

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

• Matsui Yoshinori

  The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

• Katayama Mitsuhiro

  Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

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