Raman Investigation of the Localized Vibrational Mode of Carbon in Strain-Relaxed Si1-xGex:C
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概要
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The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with $x=0$, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing $x$ from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-10-15
著者
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Itoh Kohei
Faculty Of Science And Technology Keio University
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Morita Ken
Faculty Of Science And Technology Keio University
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Harima Hiroshi
Department Of Applied Physics Osaha University
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Mizoguchi Kohji
Department Of Applied Physics Faculty Of Engineering Osaka City University
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Nielsen Brian
Institute Of Physics And Astronomy Aarhus University
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Hoffmann Lone
Institute Of Physics And Astronomy Aarhus University
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Harima Hiroshi
Department of Applied Physics, Osaka University, Osaka 565-0871, Japan
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Hoffmann Lone
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark
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Nielsen Brian
Institute of Physics and Astronomy, Aarhus University, DK-8000 Aarhus C, Denmark
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Morita Ken
Faculty of Science and Technology, Keio University, Yokohama 223-8522, Japan
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