Structural and Magnetic Anisotropy of Tb/Fe Multilayers
スポンサーリンク
概要
- 論文の詳細を見る
Local structural anisotropy of Tb/Fe multilayers (MLs) was investigated by extended X-ray absorption fine structure (EXAFS) spectroscopy. Quantitative analysis of Fe EXAFS signals was performed to estimate the coordination number related to the structural anisotropy. A difference in the Fourier-transformed Fe EXAFS spectra between two incident polarized light directions has indicated that considerable anisotropy of atomic pair ordering exists in the MLs prepared by sputtering. It was further found that the variation of the structural anisotropy well corresponds to the magnitude of the perpendicular magnetic anisotropy, which changes depending on the bilayer periods and the preparation condition.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1997-08-15
著者
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Iwata Satoshi
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Sakurai Masaki
Institute For Materials Research Tohoku University
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MASAKI Tsugihiko
Department of Electronics, Nagoya University
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Yu Xiangyou
Department Of Electronics Nagoya University
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Fujiwara Yuji
Department Of Physics Engineering Faculty Of Engineering Mie University
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Suzuki Kenji
Institute For Masterials Research Tohoku University
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Tsunashima Shigeru
Department of Electronics, Nagoya University, Nagoya 464-01, Japan
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Tsunashima Shigeru
Department of Electrical Engineering and Computer Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Iwata Satoshi
Department of Electronics, Nagoya University, Nagoya 464-01, Japan
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Fujiwara Yuji
Department of Electronics, Nagoya University, Nagoya 464-01, Japan
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Fujiwara Yuji
Department of Electronics and Electrical Engineering, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan
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Suzuki Kenji
Institute for Materials Research, Tohoku University, Sendai 980, Japan
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Sakurai Masaki
Institute for Materials Research, Tohoku University, Sendai 980, Japan
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Masaki Tsugihiko
Department of Electronics, Nagoya University, Nagoya 464-01, Japan
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Tsunashima Shigeru
Department of Applied Physics, Tokyo Institute of Technology
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