In Situ Raman Spectroscopy Observation of Crystallization Process of Sol-Gel Derived Bi4-xLaxTi3O12 Films
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概要
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In situ Raman spectra measurements have been employed to reveal the crystallization process of sol-gel derived Bi4-xLaxTi3O12 (BLT) thin films. The Raman spectra of BLT films with a La composition $x$ of 0.75 were measured with increasing temperature up to 800°C in air and N2 ambient. It is demonstrated that Bi2O2 layered structures form first at 500°C and perovskite structures start to crystallize at 600°C or higher.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2003-08-01
著者
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Osada Minoru
Presto Japan Science And Technology Corporation (jst)
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Sugita Naoki
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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Kakihana Masato
Materials & Structures Laboratory Tokyo Institute Of Technology
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Tokumitsu Eisuke
Precision & Intelligence Laboratory, Tokyo Institute of Technology,
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Sugita Naoki
Precision and Intelligence Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, Japan
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Osada Minoru
PRESTO, JST, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan
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