PS48 高密度電流下におけるカーボンナノチューブの損傷機構に関する研究(フェロー賞対象ポスターセッション)

概要

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Carbon nanotube (CNT) has peculiar electrical property depending on the chilarity. Therefore, CNT is expected to be applied to various fields. For instance, CNT is expected to be used in the line structure of advanced electronic device. CNTs are classified into Single-walled CNT (SWCNT) and Multi-walled CNT (MWCNT) according to the number of layers. MWCNT is hard to defonn and degrade in electrical characteristics by environment. And MWCNT is expected to be applied to via- material of electronic device. However, the damage mechanism of CNT under high current density has not been revealed yet. In this study, we performs the acceleration test under high current density. And we observe the damage process of CNT by atomic force microscope for reveal of damage mechanism of CNT.
一般社団法人日本機械学会の論文
2010-10-09