T0401-1-1 試験片の損傷を考慮したエレクトロマイグレーションによる金属ナノストラクチャー創製の数値シミュレーション(金属ナノ材料の創製と展開(1))

概要

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A technique of producing metallic nanostructure by utilizing electromigration has been proposed. Electromigration is the phenomenon that the metallic atoms are transported by electron wind due to high current density. A numerical simulation method of nanostructure formation utilizing electromigration was recently developed based on the governing parameter for electromigration damage, AFD^*_<gen.> However, the simulation did not include the term of specimen's damage. In the present study, the numerical simulation method of the nanostructure-production technique is developed considering electromigration damage of specimen, and the effectiveness of the method is shown through the discussion on validity of the obtained constants.
一般社団法人日本機械学会の論文
2009-09-12