A-3-5 A Heuristic Approach to Detecting Transition Faults at All Circuit Outputs
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概要
- 論文の詳細を見る
- 社団法人電子情報通信学会の論文
- 2009-09-01
著者
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KANEKO Mineo
School of Information Science, Japan Advanced Institute of Science and Technology
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IWAGAKI Tsuyoshi
School of Information Science, Japan Advanced Institute of Science and Technology
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Kaneko Mineo
School Of Information Science Japan Advanced Institute Of Science And Technology
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Iwagaki Tsuyoshi
School Of Information Science Japan Advanced Institute Of Science And Technology
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