An integer programming formulation for generating high quality transition tests (ディペンダブルコンピューティング・デザインガイア2008--VLSI設計の新しい大地)
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概要
- 論文の詳細を見る
This paper describes a test generation method to derive high quality transition tests for combinational circuits. It is known that, for a transition fault, two-pattern tests which propagate the errors to all the primary outputs reachable from the fault site can enhance the detectability of unmodeled defects. In this paper, to generate high quality transition tests, the test generation problem is formulated as a problem of integer linear programming, where a metric expressing the above fact is optimized. The proposed formulation guarantees that minimum two-pattern tests for a transition fault are generated such that the errors are observed at all the primary outputs reachable from the fault site.
- 社団法人電子情報通信学会の論文
- 2008-11-10
著者
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KANEKO Mineo
School of Information Science, Japan Advanced Institute of Science and Technology
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IWAGAKI Tsuyoshi
School of Information Science, Japan Advanced Institute of Science and Technology
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Kaneko Mineo
School Of Information Science Japan Advanced Institute Of Science And Technology
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Iwagaki Tsuyoshi
School Of Information Science Japan Advanced Institute Of Science And Technology
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