1753 太陽電池向け多結晶シリコンの強度評価(S16-6 先進材料の創成・評価,S16 先進材料の強度・機能評価とメゾメカニックス)

概要

論文の詳細を見る
Recently, the photovoltaics of polycrystalline silicon cell have been extending its front into all over the world and it is also desired to establish the reliability assessment. The presented paper describes a strength evaluation of polycrystalline silicon for photovoltaic cell by use of the fracture mechanics based on the intrinsic crack concept, taking into account the surface damage due to the manufacturing process such as a wafer slice. An attempt is made to evaluate the bending strength of polycrystalline silicon wafer regarding the surface damage as the intrinsic crack and to measure the intrinsic crack size (surface damage zone size) by the residual stress distribution analyzed by Raman spectrometry.
一般社団法人日本機械学会の論文
2005-09-18