New ADXD/EDXD Spectrometer for Determining the Structure of Melts at High Temperature
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概要
- 論文の詳細を見る
A new spectrometer for angular dispersive X-ray diffraction (ADXD) and energy dispersive X-ray diffraction (EDXD) facility has been built using a vertical type θ-θ goniometer, which makes possible to measure the diffraction profiles of high temperature melts over 200 nm^<-1>. The fundamentals of this facility were tested by obtaining the interference function of molten NaAlSi_3O_8 at 1460 K. The feasibility of the EDXD analysis for high temperature melts was also confirmed by obtaining the well resolved RDF of molten LiNbO_3 at 1550 K.X-ray DiffractionADXDEDXDRDFmelt structurehigh temperature
- 東北大学の論文
- 1996-03-28
著者
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Waseda Yoshio
Institute for Advanced Materials Processing, Tohoku University
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Waseda Yoshio
Institute For Advanced Materials Processing Tohoku University
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SUGIYAMA Kazumasa
Institute for Advanced Materials Processing (SOZAIKEN), Tohoku University
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SHINKAI Takeshi
Institute for Advanced Materials Processing, Tohoku University
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Waseda Yoshio
Institute For Advanced Materials Processing
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Shinkai T
Tmt & D Corp. Kawasaki Jpn
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Sugiyama Kazumasa
Institute For Advanced Materials Processing (amp) Tohoku University
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