New Anomalous Grazing X-ray Reflection Method for Determining the Atomic Number Density in Multi-layered Thin Film
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 1999-10-20
著者
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Saito Masatoshi
Institute For Advanced Materials Processing Tohoku University
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Waseda Yoshio
Institute For Advanced Materials Processing
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Waseda Yoshio
Instiute For Advanced Materials Processing Tohoku University
-
Saito Masatoshi
Instiute For Advanced Materials Processing Tohoku University
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