Dependence of Electrical Characteristics of NbN/TiN/NbN Josephson Junctions on Barrier Thickness and Temperature
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-12-15
著者
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Shoji A
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Shoji Akira
Electrotechnical Laboratory
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Sasaki Hajime
Semiconductor Group Mitsubishi Electric Corporation
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Sasaki Hideyuki
R&d Center Toshiba Corp.
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Yamamori Hirotake
Department Of Quantum Engineering Faculty Of Engineering Nagoya University
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Yamamori Hirotake
Electrotechnical Laboratory
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Sasaki H
Electrotechnical Laboratory
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SASAKI Hitoshi
Electrotechnical Laboratory
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Yamamori H
Electrotechnical Laboratory
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