The Hysteresis Caused by Interface Trap and Anomalous Positive Charge in Al/CeO_2-SiO_2/Silicon Capacitors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-12-15
著者
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Jung Donggeun
Department Of Physics Brain Korea 21 Physics Research Division Institute Of Basic Science And Center
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Jung Donggeun
Department Of Physics And Institute Of Basic Science Sungkyunkwan University
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Jung Donggeun
Department Of Physics Sung Kyun Kwan University
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ROH Yonghan
Department of Electronic Engineering, Sung Kyun Kwan University
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KIM Kyunghae
Department of Electronic Engineering, Sung Kyun Kwan University
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Kim Kyunghae
Department Of Electronic Engineering Sung Kyun Kwan University
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Roh Yonghan
Department Of Electronic Engineering Sung Kyun Kwan University
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