Roh Yonghan | Department Of Electronic Engineering Sung Kyun Kwan University
スポンサーリンク
概要
関連著者
-
Roh Yonghan
Department Of Electronic Engineering Sung Kyun Kwan University
-
Jung Donggeun
Department Of Physics Brain Korea 21 Physics Research Division Institute Of Basic Science And Center
-
Jung Donggeun
Department Of Physics And Institute Of Basic Science Sungkyunkwan University
-
Jung Donggeun
Department Of Physics Sung Kyun Kwan University
-
ROH Yonghan
Department of Electronic Engineering, Sung Kyun Kwan University
-
KIM Kyunghae
Department of Electronic Engineering, Sung Kyun Kwan University
-
Kim Kyunghae
Department Of Electronic Engineering Sung Kyun Kwan University
-
Kang Chang-Jin
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
-
Lee Eun-Young
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Yoo Dae-Han
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
-
Yoo Dae-Han
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Kang Chang-Jin
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Moon Joo-Tae
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
-
Moon Joo-Tae
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Lee Woong
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Jee Jeonggeun
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Bok Jinkwon
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Hyung Younwoo
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Kim Seoksik
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Hyung Younwoo
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Jee Jeonggeun
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Roh Yonghan
Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Gyeonggido 440-746, Republic of Korea
-
Bok Jinkwon
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Kim Seoksik
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
-
Lee Woong
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
著作論文
- The Hysteresis Caused by Interface Trap and Anomalous Positive Charge in Al/CeO_2-SiO_2/Silicon Capacitors
- Leakage Current Reduction Mechanism of Oxide--Nitride--Oxide Inter-Poly Dielectrics through the Post Plasma Oxidation Treatment