Yoo Dae-Han | Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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概要
関連著者
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Yoo Dae-Han
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Moon Joo-Tae
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Kang Chang-Jin
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Moon Joo-Tae
Samsung Electronics, Semiconductor R&D Center, San 16 Banwol-dong, Hwasung, Kyunggi-do 445-701, Republic of Korea
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Lee Kong-Soo
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Kim Seok-Sik
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Jeong Hanwook
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Kim Kwang-Ryul
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Choi Byoungdeog
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Lee Kong-soo
Samsung Electronics Co., Ltd., Hwasung, Kyounggi-do 446-711, Korea
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Roh Yonghan
Department Of Electronic Engineering Sung Kyun Kwan University
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Lee Eun-Young
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Hyung Yong-Woo
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Han Jae-Jong
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Jeong Hong-Sik
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Park Hyunho
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Park Hyunho
Samsung Electronics Co., Ltd., Hwasung, Kyounggi-do 446-711, Korea
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Park Hyunho
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Yeo Chadong
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Jung Soon-Moon
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Son Yong-Hoon
Samsung Electronics Co., Ltd., Yongin, Kyounggi-do 446-711, Korea
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Yoo Dae-Han
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Kang Chang-Jin
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Moon Joo-Tae
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Lee Woong
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Jee Jeonggeun
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Bok Jinkwon
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Hyung Younwoo
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Kim Seoksik
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Hyung Younwoo
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Jee Jeonggeun
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Roh Yonghan
Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Gyeonggido 440-746, Republic of Korea
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Bok Jinkwon
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Kim Seoksik
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
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Lee Woong
Samsung Electronics, Semiconductor R&D Center, Youngin, Gyeonggido 449-711, Republic of Korea
著作論文
- Low-Temperature Solid Phase Epitaxial Regrowth of Silicon for Stacked Static Random Memory Application
- Leakage Current Reduction Mechanism of Oxide--Nitride--Oxide Inter-Poly Dielectrics through the Post Plasma Oxidation Treatment
- Selective Epitaxial Growth of Silicon for Vertical Diode Application