Ferroelectricity of Bi_2SrTa_2O_9 Single Crystals Grown by the Self-Flux Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-12-15
著者
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Suzuki M
Shizuoka Univ. Hamamatsu
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Suzuki M
Department Of Electronic Engineering Faculty Of Engineering Hokkaido University
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Suzuki Mitsuru
Cryogenic Centre University Of Tokyo
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Suzuki M
Sci. Univ. Tokyo Chiba Jpn
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Suzuki M
Research Center Asahi Glass Co. Ltd.
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Suzuki Mariko
Advanced Semiconductor Devices Research Laboratories R&d Center Toshiba Corporation
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Suzuki M
Research Center Sony Corporation
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MACHIDA Akio
Research Center, SONY Corporation
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NAGASAWA Naomi
Research Center, SONY Corporation
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AMI Takaaki
Research Center, SONY Corporation
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SUZUKI Masayuki
Research Center, SONY Corporation
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Ami Takaaki
Research Center Sony Corporation
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Machida A
Research Center Sony Corporation
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Suzuki M
Department Of Electronics Graduate School Of Engineering Tohoku University
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Nagasawa Naomi
Research Center Sony Corporation
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Machida Akio
Research Center Sony Corporation
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Suzuki Masayuki
Research Center Mitsubishi Kasei Corporation
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Suzuki Masayuki
Research and Development Management Headquarters, FUJIFILM Corp., Minamiashigara, Kanagawa 250-0193, Japan
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