Selective Generation of Defects in Polydiacetylene Langmuir-Blodgett Films on Si Substrates as Studied by X-Ray Photoelectron Spectroscopy

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1996-10-15

著者

• TOMIOKA Yasushi

  Advanced Research Laboratory, Hitachi Ltd.

• Yamamoto S

  Central Research Laboratory Hitachi Ltd.

• YAMAMOTO Seiji

  Central Research Laboratory, Hitachi Ltd.

• OGAWA Taro

  Central Research Laboratory, Hitachi Ltd.

• MOCHIJI Kozo

  Central Research Laboratory, Hitachi Ltd.

• TOMIOKA Yuichi

  Department of Electrical and Electronic Systems, Saitama University

• Yamamoto Seiji

  Central Research Laboratory Hitachi Ltd.

• Ogawa Taro

  Central Research Laboratory Hitachi Ltd.

• Mochiji Kozo

  Central Research Laboratory Hitachi Ltd.

• Tomioka Y

  Department Of Electrical And Electronic Systems Saitama University

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• Selective Generation of Defects in Polydiacetylene Langmuir-Blodgett Films on Si Substrates as Studied by X-Ray Photoelectron Spectroscopy
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