Auger Electron Spectroscopy Quantitative Analysis of Interfacial SiO_2 Layer

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1995-07-15

著者

• LEE Won-Jong

  Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology

• Lee W‐j

  Department Of Advanced Materials Engineering Sejong University

• Lee Won-jong

  Department Of Computer Science Yonsei University

• SOH Ju-Won

  Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology

• Soh J‐w

  Korea Advanced Inst. Sci. And Technol. Taejon Kor

• Soh Ju-won

  Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology

関連論文

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