1-9a 色素添加反射エリプソメトリーを用いた界面液晶配向の静的電場応答の解析

概要

論文の詳細を見る
The static electrical response of the interfacial liquid crystal director was investigated by the Dye-Doped Reflection Ellipsometry (DDRE) and analyzed by a 4×4 matrix simulation based on the elastic continuum theory. By the DDRE, the transmited light is absorbed in the bulk liquid crystal (LC) which was doped with a dichroic dye and the reflected light include the information about the interfacial LC director orientation. From the numerical restilts, it is found that the DDRE can evaluate the anchoring strength. It is necessary for the evaluation of the surface anchoring strength to determine the optical parameters(thickness, refractive index) of the alignment film and those of the ITO film including tile influence of tile multiple-beam interference and that of the multiple-beam reflection. By adopting the improved DDRE with prism, we could evaluate the phase difference Δ sensitively.
日本液晶学会の論文
1998-10-12