Investigation of n-Type Pentacene Based MOS Diodes with Ultra-Thin Metal Interface Layer
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概要
- 論文の詳細を見る
In order to realize stable n-type characteristics of pentacene for applying to the organic complementary metal-oxide-semiconductor field-effect transistors (CMOS), we have fabricated pentacene based MOS diodes using ultra-thin Yb layer such as 0.5-3nm between gate insulator and pentacene. From the results of capacitance-voltage (C-V) measurements, excellent n-type C-V characteristics of the devices with 1 and 2nm-thick Yb were observed even though the devices were measured in air. These results suggested that the n-type semiconductor characteristics of pentacene are able to be improved by the thin Yb interfacial layer. Furthermore, the improved n-type characteristics of pentacene will enable the fabrication of flexible complementary logic circuits utilizing one kind organic semiconductor.
- (社)電子情報通信学会の論文
- 2011-05-01
著者
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OHMI Shun-ichiro
Tokyo Institute of Technology
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Ishiwara Hiroshi
Tokyo Institute Of Technology
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Ishiwara Hiroshi
Tokyo Inst. Of Technol. Yokohama Jpn
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SONG Young-Uk
Tokyo Institute of Technology
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- Investigation of n-Type Pentacene Based MOS Diodes with Ultra-Thin Metal Interface Layer
- Effect of Peripheral Region on the Electrical Properties of Pentacene-Based Organic Field-Effect Transistors with HfON Gate Insulator
- PREFACE
- Fabrication process of pentacene-based vertical OFETs with HfO gate insulator (シリコン材料・デバイス)
- Growth Mechanism of Pentacene on HfON Gate Insulator and Its Effect on Electrical Properties of Organic Field-Effect Transistors
- Ferroelectric Characteristics Control of (Bi,La)4Ti3O12 and SrBi2Ta2O9 Films by Addition of Silicates and Germanates
- Flattening Process of Si Surface below 1000°C Utilizing Ar/4.9%H2 Annealing and Its Effect on Ultrathin HfON Gate Insulator Formation
- Fabrication process of pentacene-based vertical OFETs with HfO_2 gate insulator