Electrical and Structural Properties of Ti/Au Ohmic Contacts on N-ZnO:Al
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Seong Tae-yeon
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (k-jist)
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Kim Han-ki
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (k-jist)
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CHOI Won-Kook
Thin Film Technology Research Center, Korea Institute of Science and Technology
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Choi Won-kook
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Seong Tae-yeon
Department Of Materials Science And Engineering And Centre For Electronic Materials Research Kwangju
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Seong Tae-yeon
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (kjist)
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Choi Won-kook
Thin Film Technology Research Center Korea Institute Of Science And Technology (kist)
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Han Sang-heon
Department Of Management Information System Administration Nagoya University Of Commerce & Busin
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Han Sang-heon
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (kjist)
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KIM Kyung-Kook
Department of Materials Science and Engineering, Kwangju Institute of Science and Technology (KJIST)
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Kim Kyung-kook
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (kjist)
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Kim Han-ki
Department Of Materials Science And Engineering Kwangju Institute Of Science And Technology (kjist)
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Kim Han-Ki
Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin, Gyeonggi 446-701, Republic of Korea
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