Optical properties of ultrathin copper thin films sandwiched between Nb-doped TiO2 films studied with spectroscopic ellipsometry
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Kim Han-Ki
Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin, Gyeonggi 446-701, Republic of Korea
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Kong Bo
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Cho Hyung
School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Lee Hosuk
Department of Applied Physics, Kyung Hee University, Yongin 446-701, Korea
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Lee Hosun
Department of Applied Physics, Kyung Hee University, Yongin 446-701, Korea
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Park Jun-Hyuk
Department of Advanced Materials Engineering for Electronics and Information, Kyung Hee University, Suwon 446-701, Korea
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