Reply to "Comment on 'Optical Characterization of Si_<1-x>C_x/Si (0 ≤ x ≤ 0.014) Semiconductor Alloys'"

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概要

• 論文の詳細を見る

• Based on the previous comment by Zollner et al., we discuss the possibility that the double feature in the derivative spectra of the dielectric functions of Si_<1-x>C_x/Si (0 ≤ x ≤ 0.014) and Si_<0.924-x>Ge_<0.076>C_x/Si (0 ≤ x ≤ 0.014) alloys grown using solid phase epitaxy may come from interference phenomenon. We emphasize that the argument does not change the main content of our previous reports.

• 社団法人応用物理学会の論文
• 1996-11-15

著者

• LEE Hosun

  Department of Physics, Kyung Hee University

• Lee Hosun

  Department Of Physics College Of Natural Sciences And Imst Kyung Hee University

• Lee Hosun

  Department Of Physics And Institute Of Natural Sciences Kyung Hee University

• Lee Hosun

  Department of Applied Physics, Kyung Hee University, Yongin 446-701, Korea

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