Enhancement of Photoluminescence and Electrical Properties of Ga-Doped ZnO Thin Film Grown on α-Al_2O_3(0001) Single-Crystal Substrate by rf Magnetron Sputtering through Rapid Thermal Annealing(Optics Properties of Condensed Matter)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2001-10-01
著者
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Cho Jun-sik
School Of Materials Science And Engineering Yonsei University
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Choi W‐k
Thin Film Technology Research Center Korea Institute Of Science And Technology
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CHO Jung
School of Materials Science and Engineering, Yonsei University
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NAH Jongbum
Thin Film Technology Research Center, Korea Institute of Science and Technology
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OH Min-Seok
Thin Film Technology Research Center, Korea Institute of Science and Technology
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SONG Jae-Hoon
Thin Film Technology Research Center, Korea Institute of Science and Technology
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YOON Ki-Hyun
School of Materials Science and Engineering, Yonsei University
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JUNG Hyung-Jin
Thin Film Technology Research Center, Korea Institute of Science and Technology
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CHOI Won-Kook
Thin Film Technology Research Center, Korea Institute of Science and Technology
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Choi Won-kook
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Yoon Ki-hyun
School Of Materials Science And Engineering Yonsei University
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Nah Jongbum
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Song Jae-hoon
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Jung H‐j
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Jung Hyung-jin
Thin Film Technology Research Center Korea Institute Of Science And Technology
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Oh Min-seok
Thin Film Technology Research Center Korea Institute Of Science And Technology
関連論文
- Enhancement of Photoluminescence and Electrical Properties of Ga-Doped ZnO Thin Film Grown on α-Al_2O_3(0001) Single-Crystal Substrate by rf Magnetron Sputtering through Rapid Thermal Annealing(Optics Properties of Condensed Matter)
- Thin Film Growth and Surface Modification by keV Ion Beam
- Effect of Oxygen Ion Energy and Annealing in Formation of Tin Oxide Thin Films
- Auger Electron and X-Ray Photoelectron Spectroscopy Studies of Oxidation of Tin Using SnO_x Thin Films Grown by Reactive Ion-Assisted Deposition
- Measurement Error Induced by Air Gap of Electromagnetic Wave Absorber in the Coaxial Line Method
- Electrical and Structural Properties of Ti/Au Ohmic Contacts on N-ZnO:Al
- La-Ca-Mn-O Thin Film based Thermistor for Measuring Low Temperature of 77-230K
- Study of Electron Energy Distribution Functions (EEDFs) in Three DC Low-Pressure Plasma Sources