Double-Slit Interference Observation of Hot Electrons in Semiconductors : Analysis of Experimental Data
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-05-15
著者
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MIYAMOTO Yasuyuki
Graduate School of Science and Engineering, Tokyo Institute of Technology
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FURUYA Kazuhito
Graduate School of Science and Engineering, Tokyo Institute of Technology
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町田 信也
東京工業大学大学院理工学研究科:科学技術振興機構crest
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NINOMIYA Yasunori
Graduate School of Science and Engineering, Tokyo Institute of Technology
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MACHIDA Nobuya
Graduate School of Science and Engineering, Tokyo Institute of Technology
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Machida Nobuya
Department Of Physical Electronics Tokyo Institute Of Technology:crest Japan Science And Technology
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Ninomiya Yasunori
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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Furuya Kazuhito
Tokyo Institute Of Technology
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Miyamoto Yasuyuki
Tokyo Inst. Technol. Tokyo Jpn
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Furuya Kazuhito
Graduate School of Science and Engineering Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8552, Japan
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Machida Nobuya
Graduate School of Science and Engineering Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8552, Japan
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