Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient
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概要
- 論文の詳細を見る
- 2004-10-01
著者
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NAKANO Takayoshi
Department of Materials Science and Engineering, Osaka University Graduate School of Engineering
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Hata S
Department Of Applied Science For Electronics And Materials Kyushu University
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Umakoshi Yukichi
Department Of Materials Science And Engineering & Frontier Research Center Graduate School Of En
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Itakura Masaru
Department Of Applied Science For Electronics And Materials Kyushu University
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HATA Satoshi
Department of Applied Science for Electronics and Materials, Kyushu University
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Kuwano Noriyuki
Art Science And Technology Center For Cooperative Research
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Nakano Takayoshi
Department Of Materials Science And Engineering Osaka University Graduate School Of Engineering
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Hata Satoshi
Department Of Applied Science For Electronics And Materials Kyushu University
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Hata Satoshi
Department Of Applied Science For Electronics And Materials Interdisciplinary Graduate School Of Eng
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KUWANO Noriyuki
Art, Science and Technology Center for Cooperative Research, Kyushu University
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Nakano Takayoshi
Department Of Materials Science And Engineering & Frontier Research Center Graduate School Of En
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SHIRAISHI Kohjiro
Department of Applied Science for Electronics and Materials
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KUWANO Noriyuki
Art, Science and Technology Center for Cooperative Research
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