Short-Range Ordered Structure of Ga_<0.47>In_<0.53>As Studied by Energy-Filtered Electron Diffraction and HREM
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-02-01
著者
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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ZUO Jianm-Min
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
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GOMYO Akiko
Opto-Electronics Research Laboratories, NEC Corporation
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Gomyo Akiko
Opto-electronics Research Laboratories Nec Corporation
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Spence J
Arizona State Univ. Az Usa
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Zuo J‐m
Univ. Illinois At Urbana‐champaign Il Usa
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Zuo Jianm-min
Department Of Materials Science And Engineering University Of Illinois At Urbana-champaign
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Spence John
Department Of Biological Sciences University Of Alberta
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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Shindo Daisuke
Institute for Advanced Materials Processing, Tohoku University
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