Effect of diffraction condition on mean free path determination by EELS
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2001-02-01
著者
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Shindo Daisuke
Inst. Of Multidisciplinary Res. For Advanced Materials Tohoku Univ.
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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Murakami Yasukazu
Institiute For Advanced Materials Processing Tohoku University
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Murakami Y
Tohoku Univ. Sendai Jpn
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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Shindo Daisuke
Tohoku Univ. Sendai Jpn
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- PREFACE
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