Thickness Measurement of Amorphous SiO_2 by EELS and Electron Holography
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概要
- 論文の詳細を見る
- Japan Institute of Metalsの論文
- 2000-09-20
著者
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Lee C‐w
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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Lee C‐w
The School Of Information Communications And Electronics Engineering The Catholic University Of Kore
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IKEMATSU Yoichi
Institute for Advanced Materials Processing, Tohoku University
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LEE Chang-Woo
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Ikematsu Y
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Ikematsu Yoichi
Institute For Advanced Materials Processing Tohoku University
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Lee Chang-woo
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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- PREFACE
- Magnetic Domain Structures of Nd-Fe-B based Permanent Magnets Studied by Electron Holography and Lorentz Microscopy
- Magnetization Process in Sm_2Fe_N_3 Fine Powders Studied Using Lorentz Microscopy and Electron Holography
- Characterization of the charging effect in a ZrO_2 sintered body by Ga ion beam irradiation
- Observation of Microstructures and Magnetic Domains of Sm-Co Based Permanent Magnets by High-Voltage Electron Microscopy
- Quantitative analysis of a high-resolution electron microscope image of WO_3 block structure with a residual index
- Structure Modulation of Al0.5In0.5P Studied by Energy-Filtered Electron Diffraction and High-Resolution Electron Microscopy
- Lattice Modulation Preceding to the R-phase Transformation in a Ti_Ni_Fe_2 Alloy Studied by TEM with Energy-Filtering
- Evaluation of a Spherical Aberration Constant of the Objective Lens of HVEM at Tohoku University
- Observation of Electric Potential Distribution in Model Capacitor Sample Using Electron Holography
- Electron Holography of Nanocrystalline Magnetic Materials
- Correlation between Switching Field and Microstructure of Individual Co/Pt Dots
- Determination of Orbital Location of Electron-Induced Secondary Electrons by Electric Field Visualization
- Transmission Electron Microscopy Study on Microstructure of Tungsten/Carbon Multilayer Films
- Structural Differences between Al–Fe–Cu and Al–Li–Cu Quasicrystals Studied by High-Resolution Electron Microscopy