Sensitivity and Fading Characteristics of the 25μm Pixel Size Imaging Plate for Transmission Electron Microscopes
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-06-01
著者
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Oikawa Tetsuo
Jeol Ltd
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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Taniyama A
'institute For Advanced Materials Processing Tohoku University
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Taniyama A
Corporate Research And Development Laboratories Sumitomo Metal Industries Ltd.
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Taniyama Akira
Institute For Advanced Materials Processing Tohoku University
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Oikawa T
Jeol Ltd
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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