Substantial Contribution to a Cantilever Resonance Frequency Shift in Magnetic Resonance Force Microscopy(Condensed matter: structure and mechanical and thermal properties)
スポンサーリンク
概要
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We report a cantilever resonance frequency shift due to the magnetic resonance force gradient in magnetic resonance force microscopy. Our experimental results obtained for a phantom sample of diphenylpicrylhydrazil (DPPH) at T=14K can be quantitatively understood with the magnetic force gradient containing the first derivative of spin magnetization. This substantial contribution should be explicitly treated when calculating an equipment function and estimating the number of spins through the deconvolution process for image restoration.
- 2009-03-15
著者
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PARK Hyun
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Shindo Daisuke
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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Tsuji Shigenori
Crest Jst:advanced Technology Division Jeol Ltd.
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INOMATA Kohsuke
Graduate School of Engineering, Kyoto University
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YOSHINARI Yohsuke
CREST, JST
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Yoshinari Yohsuke
Crest Jst:advanced Technology Division Jeol Ltd.
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Park Hyun
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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Inomata Kohsuke
Graduate School Of Engineering Kyoto University:crest Jst
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