High-voltage, high-resolution electron microscopy study on thin sections of phase change optical disk prepared by an ultramicrotome
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1999-06-01
著者
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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Yang Jun-mo
Institute For Advanced Materials Processing. Tohoku University
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Yang Jun-mo
Institute For Advanced Materials Processing Tohoku University
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Park Gyeong-su
Samsung Advanced Institute Of Technology
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HONG Hyeon-Chang
DVD R&D Center, Samsung Electronics Co., Ltd.
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Hong Hyeon-chang
Dvd R&d Center Samsung Electronics Co. Ltd.
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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