EDS elemental mapping of a DRAM with an FE-TEM

スポンサーリンク

概要

著者

関連論文

Photonic Crystal Structure of Wing Scales in Sasakia Charonda Butterflies
Application of Nano-Diffraction to Local Structure Analysis of Amorphous Pd_Si_ Alloy Thin Films
Comparison of Planar to Columnar Transformation of PtSi Layers on Si(001) and Si(111) Substrates in the Si Capping Layer Growth Process
Growth Temperature Dependence of Boron Surface Segregation and Electrical Properties of Boron Delta-Doped Structures Grown by Si Molecular Beam Epitaxy
Control of Grain Structure of Laser-Deposited (Ba, Sr)TiO_3 Films to Reduce Leakage Current ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
Quantitative intensity measurement of equal thickness fringes in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate
Transmiccion electron microscopy study of a semiconducting SrTiO_3 ceramic condenser
Cross-Sectional Transmission Electron Microscopy of ZnO Tetrapod-Like Particles
Fabrication of ZnO Nanopillars by Atomic Layer Deposition
High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures
Quantitative Analysis of Short-Range Order Diffuse Scattering in Cu-27.5 at%Pd Alloy with Energy-Filtered Electron Diffraction
Electron Microscopic Observation on Sulphuration of Vacuum-Deposited Silver Films
Observation of V Defects in Multiple InGaN/GaN Quantum Well Layers
High-Resolution Scanning Electron Microscopy Observation of GaN/AlGaN Strained-Layer Superstructures in GaN-Based Violet Laser Diodes
Retrieval process of high-resolution HAADF-STEM images
Artificial bright spots in atomic-resolution high-angle annular dark field STEM images
Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images
High-resolution transmission electron microscopy of Fe-Al powder particles
A new specimen preparation method for cross-section TEM using diamond powders
EELS elemental mapping of a DRAM with FE-TEM
EDS elemental mapping of a DRAM with an FE-TEM
Cathodoluminescence scanning electron microscopy observations of (SrBaCa)TiO_3 ceramic varistors
A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder
Observation of ZnO Particles Grown by Electrochemical Reaction of Zn
In-Plane Orientations and Grain Boundaries of YBa_2Cu_3O_ Thin Films on (001) MgO Substrates Grown by Metalorganic Chemical Vapor Deposition
Oxides: neutron and synchrotron X-ray diffraction studies
Structure and Electro-Optical Properties of Thin Films Grown by Alternate Atomic Layer Deposition of ZnO and Al_2O_3 on the Sapphire Substrate
Direct imaging of Guinier-Preston zones by high-angle annular detector dark-field scanning transmission electron microscopy
Evaluation of the characteristics of a slow-scan CCD camera for a transmission electron microscope
Detective quantum efficiency of the 25 μm pixel size Imaging Plate for transmission electron microscopes
Sensitivity and Fading Characteristics of the 25μm Pixel Size Imaging Plate for Transmission Electron Microscopes
Differential Scanning Calorimetry of the Coalescenece Growth of Fine Smoke Particles
Effect of Scattering Angle on Energy Loss Near-Edge Structure of h-BN
Electronic structure changes associated with a martensitic transformation in a Ti_Ni_Fe_2 alloy studied by electron energy-loss spectroscopy
Reaction of Iodine Vapor with Silver Films in the α-AgI Phase Region
Reaction of Iodine Vapor with Copper Films
Temperature and Iodine-Pressure Dependences of Electrical Conductivity of β-AgI Films
Quantification of Oxygen Vacancies in Parasite using a 300 kV HREM with an Imaging Plate
Detection of Oxygen Vacancies in BaMnO3-x with 200kV Electron Microscopes
High-Resolution Electron Microscopic Studies of CS Structure in Reduced WO_3 Thin Crystals
Electron Microscopic Studies of Structure and Crystallization of Amorphous Metal Oxide Films
Structure and Crystallization of Very Thin Amorphous WO_3 Films
Measurement of electric potential distributions around FEG-emitters by electron holography
PREFACE
Ultra-Fast Spectrometric Cathodoluminescence Scanning Microscopy for Materials Analysis

もっと見る

スポンサーリンク