Lee C‐w | Institute Of Multidisciplinary Research For Advanced Materials Tohoku University

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概要

• 同名の論文著者
• Institute Of Multidisciplinary Research For Advanced Materials Tohoku Universityの論文著者

関連著者

• Lee C‐w

  Institute Of Multidisciplinary Research For Advanced Materials Tohoku University

• Lee C‐w

  The School Of Information Communications And Electronics Engineering The Catholic University Of Kore

• SHINDO Daisuke

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

• Shindo Daisuke

  Institute For Advanced Materials Processing Tohoku University

• LEE Chang-Woo

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

• Ikematsu Y

  Institute Of Multidisciplinary Research For Advanced Materials Tohoku University

• Lee Chang-woo

  Institute Of Multidisciplinary Research For Advanced Materials Tohoku University

• Shindo Daisuke

  Institiute For Advanced Materials Processing Tohoku University

• 進藤 大輔

  東北大 多元研

• IKEMATSU Yoichi

  Institute for Advanced Materials Processing, Tohoku University

• Ikematsu Yoichi

  Institute For Advanced Materials Processing Tohoku University

• LEE Chang-Woo

  the School of Information, Communications and Electronics Engineering, The Catholic University of Ko

• IKEMATSU Yoichi

  Present address

• SUZUKI Tohru

  Photonics and Wireless Devices Research Laboratories, NEC Corporation

• ICHIHASHI Toshinari

  Silicon Systems Laboratories, NEC Corporation

• HSU Chung-Chi

  Department of Electronic Engineering, The Chinese University of Hong Kong

• Hsu Chung-chi

  Department Of Electronic Engineering The Chinese University Of Hong Kong

• Suzuki Tohru

  Photonics And Wireless Devices Research Laboratories Nec Corporation

• Lee Chang

  Institute Of Functional Genomics School Of Medicine Konkuk University

• Suzuki Tohru

  Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan

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著作論文

• Efficient Algorithm for Decoding Concatenated Codes(Fundamental Theories for Communications)
• Measurement of mean free paths for inelastic electron scattering of Si and SiO_2
• Energy-filtered electron diffraction and high-resolution electron microscopy on short-range ordered structure in GaAs_Sb_
• Thickness Measurement of Amorphous SiO_2 by EELS and Electron Holography

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