HSU Chung-Chi | Department of Electronic Engineering, The Chinese University of Hong Kong
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概要
- Hsu Chung-Chiの詳細を見る
- 同名の論文著者
- Department of Electronic Engineering, The Chinese University of Hong Kongの論文著者
関連著者
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SUZUKI Tohru
Photonics and Wireless Devices Research Laboratories, NEC Corporation
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HSU Chung-Chi
Department of Electronic Engineering, The Chinese University of Hong Kong
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進藤 大輔
東北大 多元研
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Lee C‐w
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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GOMYO Akiko
Fundamental and Environmental Research Laboratories, NEC Corporation
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Lee C‐w
The School Of Information Communications And Electronics Engineering The Catholic University Of Kore
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Gomyo Akiko
Fundamental And Environmental Research Laboratories Nec Corporation
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ICHIHASHI Toshinari
Fundamental Research Laboratories, NEC Corporation
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LEE Chang-Woo
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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IKEMATSU Yoichi
Present address
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ICHIHASHI Toshinari
Silicon Systems Laboratories, NEC Corporation
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Ikematsu Y
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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OHKOUCHI Shunsuke
Photonic and Wireless Devices Research Laboratories, NEC Corporation
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FURUHASHI Takahisa
Department of Materials Science & Engineering, Tokyo Institute of Technology
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Hsu Chung-chi
Department Of Electronic Engineering The Chinese University Of Hong Kong
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Lee Chang-woo
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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Suzuki Tohru
Photonics And Wireless Devices Research Laboratories Nec Corporation
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Lee Chang
Institute Of Functional Genomics School Of Medicine Konkuk University
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Suzuki Tohru
Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
著作論文
- Energy-filtered electron diffraction and high-resolution electron microscopy on short-range ordered structure in GaAs_Sb_
- Atomic Arrangement in a Triple-period A-type Ordered GaInP Layer Grown with Sb Addition during Metal Organic Vapor Phase Epitaxy Observed by Cross Sectional Scanning Tunneling Microscope