Suzuki Tohru | Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
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概要
- Suzuki Tohruの詳細を見る
- 同名の論文著者
- Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japanの論文著者
関連著者
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Suzuki Tohru
Photonics And Wireless Devices Research Laboratories Nec Corporation
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Suzuki Tohru
Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
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Gomyo Akiko
Fundamental And Environmental Research Laboratories Nec Corporation
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SUZUKI Tohru
Photonics and Wireless Devices Research Laboratories, NEC Corporation
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Hsu Chung-chi
Department Of Electronic Engineering The Chinese University Of Hong Kong
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進藤 大輔
東北大 多元研
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SHINDO Daisuke
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Lee C‐w
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Shindo Daisuke
Institute For Advanced Materials Processing Tohoku University
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GOMYO Akiko
Fundamental and Environmental Research Laboratories, NEC Corporation
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Lee C‐w
The School Of Information Communications And Electronics Engineering The Catholic University Of Kore
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Gomyo Akiko
Fundamental Research Laboratories Nec Corporation
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Kawamura Yuichi
Research Institute For Advanced Science And Technology Osaka Prefecture University
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INOUE Naohisa
Research Institute for Advanced Science and Technology, Osaka Prefecture University
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Kawamura Yuichiro
Department Of Materials Science And Engineering Graduate School Of Engineering Osaka University
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Inoue N
Department Of Electrical And Electronic Engineering National Defense Academy
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Inoue Naohisa
Research Institute For Advanced Science And Technology Osaka Prefecture University
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LEE Chang-Woo
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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IKEMATSU Yoichi
Present address
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ICHIHASHI Toshinari
Silicon Systems Laboratories, NEC Corporation
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HSU Chung-Chi
Department of Electronic Engineering, The Chinese University of Hong Kong
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Ikematsu Y
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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HIGASHINO Toshiyuki
Research Institute for Advanced Science and Technology, Osaka Prefecture University
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OHKOUCHI Shunsuke
Photonic and Wireless Devices Research Laboratories, NEC Corporation
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FURUHASHI Takahisa
Department of Materials Science & Engineering, Tokyo Institute of Technology
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Inoue Narumi
Superconductivity Research Laboratory International Superconductivity Technology Center
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KAWAMURA Yuichi
Frontier Science Innovation Center Osaka Prefecture University
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Lee Chang-woo
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Higashino T
Research Institute For Advanced Science And Technology Osaka Prefecture University
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Shindo Daisuke
Institiute For Advanced Materials Processing Tohoku University
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Ichihashi Toshinari
Fundamental Research Laboratories Nec Corporation
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Lee Chang
Institute Of Functional Genomics School Of Medicine Konkuk University
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Ohkouchi Shunsuke
Photonic and Wireless Devices Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
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Furuhashi Takahisa
Department of Materials Science & Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8502, Japan
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Hsu Chung-Chi
Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, China
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Ichihashi Toshinari
Fundamental and Environmental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
著作論文
- Energy-filtered electron diffraction and high-resolution electron microscopy on short-range ordered structure in GaAs_Sb_
- Band-Gap Change in Ordered/Disordered GaAs_Sb_y Layers Grown on (001) and (111)B InP Substrates : Semiconductors
- Atomic Arrangement in a Triple-period A-type Ordered GaInP Layer Grown with Sb Addition during Metal Organic Vapor Phase Epitaxy Observed by Cross Sectional Scanning Tunneling Microscope