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Taiwan Semiconductor Manufacturing Company | 論文
- Systematical Study of Reliability Issues in Plasma-Nitrided and Thermally Nitrided Oxides for Advanced Dual-Gate Oxide p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
- Hot-Carrier-Induced Degradation on 0.1 μm Partially Depleted Silicon-On-Insulator Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor
- Effects of Tungsten Polycide Process and Post-Polyoxidation Rapid Thermal Process on Electrical Characteristics of Thin Polysilicon Oxide
- Anomalous Current-Voltage Characteristics and Threshold Voltage Shift in Implanted-Polysilicon-Gated Complementary Metal-Oxide-Semiconductor Field-Effect Transistors with/without Titanium-Polycide Technology
- New Observations on Hot-Carrier Degradation in 0.1 μm Silicon-on-Insulator n-Type Metal Oxide Semiconductor Field Effect Transistors : Semiconductors
- A Unified Functional Reliability Model for N-channel Metal-Oxide-Semiconductor Field-Effect Transistors with Sub 2 nm Gate Oxide
- Monte Carlo Sphere Model for Effective Oxide Thinning Induced Extrinsic Breakdown
- Monte-Carlo Sphere Model for "Effective Oxide Thinning" Induced Extrinsic Breakdown
- A New Dual Floating Gate Flash Cell for Multilevel Operation
- Strain Efficiency Enhancement with Stress Intermedium Engineering (SIE) for Sub-65nm CMOS Scaling
- The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability
- A Novel Approach for Quantifying Contamination in Multiply Charged Implantation
- Investigation of Inversion C-V Reconstruction for Long-Channel MOSFETs with Leaky Dielectrics using Intrinsic Input Resistance Approach
- Characteristics and Improvement in Hot-Carrier Reliability of Sub-Micrometer High-Voltage Double Diffused Drain Metal–Oxide–Semiconductor Field-Effect Transistors
- Effect of Strain on Static and Dynamic NBTI of pMOSFETs
- Compact Expressions for Crosstalk of Multiple Bit Lines in DRAM
- SOI Transistor/Power Scaling and Scaling-Strengthened Strain
- Fully Analytical Modeling of Cu Interconnects Up to 110GHz
- Geometry Effect on SiGe Heterojunction Bipolar Transistor Unit Cell for 1 W High-Efficiency RF Power Amplifier Applications
- Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors