Kwon Hyuck-in | School Of Eecs Kyungpook National University
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概要
関連著者
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Kwon Hyuck-in
School Of Eecs Kyungpook National University
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Lee Jong-ho
School Of Eecs Engineering Kyungpook National University
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Lee Jong-Ho
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
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Choi Byung-kil
School Of Electrical Engineering And Computer Science Kyungpook National Univ.
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Cho Il
Department Of Biotechnology Chung-ang University
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Lee Jong-ho
School Of Electrical Engineering Wonkwang University
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Lee Jong-ho
School Of Electronic Engineering Daegu University Jillyang
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Jung Han-a-reum
School Of Eecs Kyungpook National University
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PARK Ki-Heung
School of Electrical Engineering and Computer Science, Kyungpook National Univ.
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Park Ki-heung
School Of Eecs Kyungpook National University
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Kim Sungchul
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Song Sang-Hun
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
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Jeong Chan-Yong
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
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Jeong Min-Kyu
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
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Kim Dong
School Of Electrical And Electronic Engineering At Yonsei University
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Han Kyoung-rok
School Of Electrical Engineering And Computer Science Kyungpook National Univ.
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Kim Dae-hwan
School Of Electrical Engineering Kookmin University
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Kim Dae
School Of Biotechnology And Bioengineering Kangwon National University
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Kim Sun
Semiconductor R&d Division Samsung Electronics
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Choi Byung-Kil
Memory R&D Division, Hynix Semiconductor Inc., Ichon, Gyeonggi-do 467-701, Korea
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Park Sang-Hee
Transparent Electronics Team, Electronics and Telecommunications Research Institute, 138 Gajeongno, Yuseong-gu, Daejeon 305-700, Korea
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Kwon Hyuck-In
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
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Kong Dongsik
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Jeon Young
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Kim Yongsik
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Park Jae
Semiconductor Laboratory, Samsung Advanced Institute of Technology, Yongin, Gyeonggi 446-712, Korea
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Kim Chang
Semiconductor Laboratory, Samsung Advanced Institute of Technology, Yongin, Gyeonggi 446-712, Korea
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Cho In-Tak
Inter-University Semiconductor Research Center, Seoul National University, Seoul 151-742, Korea
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Cho In-Tak
School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Buk-gu, Daegu 702-701, Korea
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Jeong Min-Kyu
School of Electrical Engineering and Computer Science, Kyungpook National University, Sankyuk-dong, Buk-gu, Daegu 702-701, Korea
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Jeong Min-Kyu
ISRC and School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Lee Jong-Ho
ISRC and School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
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Kim Dong
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Kwon Hyuck-In
School of Electric Engineering, Daegu University, Jillyang-eup, Gyeongsan, Gyeongbuk 712-714, Korea
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Kwon Hyuck-In
School of Electronic Engineering, Daegu University, Gyeongsan, Gyeongsangbukdo 712-714, Korea
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Sohn Joonsung
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
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Kim Dae-Hwan
School of Electrical Engineering, Kookmin University, Seoul 136-702, Korea
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Shin Hyungcheol
School of Electrical Eng.
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Kim Sun
Semiconductor Laboratory, Samsung Advanced Institute of Technology, Yongin, Gyeonggi 446-712, Korea
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Kim Dong
School of Clinical Sciences, University of Bristol
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Kim Young
Foundry Business Team, System LSI Division, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea
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Park Ick-Joon
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
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Cho Euo-Sik
Department of Electronic Engineering, Gachon University, Gyeonggi-do 461-701, Korea
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Ryu Min
Transparent Electronics Team, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea
著作論文
- Characteristics of Locally-Separated Channel FinFETs with Non-Overlapped Source/Drain to Gate for Sub-50nm DRAM Cell Transistors(Session2: Silicon Devices I)
- Characteristics of Locally-Separated Channel FinFETs with Non-Overlapped Source/Drain to Gate for Sub-50nm DRAM Cell Transistors(Session2: Silicon Devices I)
- Analytic Oxide Capacitance Model of Double- and Surrounding-Gate Metal–Oxide–Semiconductor Field-Effect Transistors in Linear Region by Considering Inversion-Layer Capacitance
- Impact of High-$k$ HfO2 Dielectric on the Low-Frequency Noise Behaviors in Amorphous InGaZnO Thin Film Transistors
- AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
- Design of Bulk Fin-Type Field-Effect Transistor Considering Gate Work-Function
- Effects of Body Doping in a NAND Flash String without Source/Drain
- Current Model of Fully Depleted Nanoscale Surrounding-Gate Metal–Oxide–Semiconductor Field-Effect Transistors with Doped Channel in All Operation Regions
- Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates
- Passivation of the Exposed Silver Electrodes on a Tuning Fork Crystal Oscillator by Chronoamperometry
- Threshold Voltage Modeling of Fully Depleted Nanoscale Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors with Doped Channel by Considering Drain Bias
- Compact Current Modeling of Fully Depleted Symmetric Double-Gate Metal–Oxide–Semiconductor Field Effect Transistors with Doped Short-Channel