Ryu Min | Transparent Electronics Team, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea

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概要

関連著者

Kwon Hyuck-in
School Of Eecs Kyungpook National University
Park Sang-Hee
Transparent Electronics Team, Electronics and Telecommunications Research Institute, 138 Gajeongno, Yuseong-gu, Daejeon 305-700, Korea
Cho In-Tak
School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Buk-gu, Daegu 702-701, Korea
Song Sang-Hun
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
Jeong Chan-Yong
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
Lee Jong-Ho
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
Park Ick-Joon
School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea
Cho Euo-Sik
Department of Electronic Engineering, Gachon University, Gyeonggi-do 461-701, Korea
Ryu Min
Transparent Electronics Team, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea

著作論文

Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates

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