Asada Kunihiro | Vlsi Design And Education Center (vdec) The University Of Tokyo

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概要

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著作論文

All-digital ramp waveform generator for two-step single-slope ADC
Time Difference Amplifier with Robust Gain Using Closed-Loop Control
Approaches for Reducing Power Consumption in VLSI Bus Circuits (Special Issue on Low-Power High-Speed CMOS LSI Technologies)
Autonomous di/dt Control of Power Supply for Margin Aware Operation(Electronic Circuits)
Preliminary Experiments for Power Supply Noise Reduction Using On-Board Stubs(Papers Selected from AP-ASIC 2004)
On-Chip di/dt Detector Circuit(Microelectronic Test Structures)
Stub vs. Capacitor for Power Supply Noise Reduction(Electronic Circuits)
Initial Stage of Stress-Induced Migration Phenomenon in Aluminum Interconnection on Semiconductor Device
Noise Immunity Investigation of Low Power Design Schemes(Electronic Circuits)
Device Parameter Estimation of SOI MOSFET Using One-Dimensional Numerical Simulation Considering Quantum Mechanical Effects
LSI Design Flow for Shot Reduction of Character Projection Electron Beam Direct Writing Using Combined Cell Stencil(Physical Design,VLSI Design and CAD Algorithms)
A System Level Optimization Techinique for Application Specific Low Power Memories(Special Section on VLSI Design and CAD Algorithms)
Design of a Conditional Sign Decision Booth Encoder for a High Performance 32 ★ 32-Bit Digital Multiplier
On-Chip Resonant Supply Noise Canceller Utilizing Parasitic Capacitance of Sleep Blocks for Power Mode Switch
All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter
A 0.25-μm Si-Ge Fully Integrated Pulse Transmitter with On-Chip Loop Antenna Array towards Beam-Formability for Millimeter-Wave Active Imaging
A 65-nm CMOS Fully Integrated Shock-Wave Antenna Array with On-Chip Jitter and Pulse-Delay Adjustment for Millimeter-Wave Active Imaging Application
Low Pass Filter-Less Pulse Width Controlled PLL Using Time to Soft Thermometer Code Converter
On-Chip Switched Parasitic Capacitors of Sleep Blocks for Resonant Supply Noise Reduction
High-Throughput Electron Beam Direct Writing of VIA Layers by Character Projection with One-Dimensional VIA Characters
Initial Stage of Stress-Induced Migration Phenomenon in Aluminum Interconnection on Semiconductor Device
A Structured Routing Architecture for Practical Application of Character Projection Method in Electron-Beam Direct Writing

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