Toriumi Akira | Ulsi Research Center Toshiba Corporation
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概要
関連著者
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Toriumi Akira
Ulsi Research Center Toshiba Corporation
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Toriumi Akira
Ulsi Research Laboratories Toshiba Corporation
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Ohata Akiko
Ulsi Research Laboratories Toshiba Corporation
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Takagi Shin-ichi
Ulsi Research Laboratories Toshiba Corporation
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Toriumi Akira
Mirai-advanced Semiconductor Research Center (mirai-asrc) National Institute Of Advanced Industrial
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TAKAGI Shin-ichi
ULSI Research Laboratories, TOSHIBA Corporation
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Koga Junji
Ulsi Research Laboratories Toshiba Corporation
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Yasuda Naoki
Mirai-aset Aist
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Yasuda Naoki
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Co.
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SATAKE Hideki
ULSI Research Laboratories, TOSHIBA Corporation
著作論文
- Two Correlated Mechanisms in Thin SiO_2 Breakdown
- Reliability of Structurally Modified Ultra-Thin Gate Oxides
- Observation of Oxide Thickness Dependent Interface Roughness in Si MOS Structure
- Existence of Double-Charged Oxide Traps in Submicron MOSFET's (SOLID STATE DEVICES AND MATERIALS 1)
- Coulomb Blockade Effects in Edge Quantum Wire SOI MOSFETs
- Silicon-Based Single-Electron-Tunneling Transistor Operated at 4.2 K
- Evidence for Asymmetrical Hydrogen Profile in Thin D_2O Oxidized SiO_2 by SIMS and Modified TDS
- Three-Terminal Silicon Esaki Tunneling Device
- Coulomb Blockade Effects in Edge Quantum Wire SOl-MOSFETs (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
- Coulomb Blockade Effects in Edge Quantum Wire SOI MOSFETs