Takagi Shin-ichi | Ulsi Research Laboratories Toshiba Corporation
スポンサーリンク
概要
関連著者
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Takagi Shin-ichi
Ulsi Research Laboratories Toshiba Corporation
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Toriumi Akira
Ulsi Research Center Toshiba Corporation
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TAKAGI Shin-ichi
ULSI Research Laboratories, TOSHIBA Corporation
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Toriumi Akira
Ulsi Research Laboratories Toshiba Corporation
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Toriumi Akira
Mirai-advanced Semiconductor Research Center (mirai-asrc) National Institute Of Advanced Industrial
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Koga Junji
Ulsi Research Laboratories Toshiba Corporation
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Muraoka Kouichi
Ulsi Research Laboratories Toshiba Corporation
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Yasuda Naoki
Mirai-aset Aist
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Takagi S
Process & Manufacturing Center Semiconductor Company Toshiba Corporation
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Yasuda Naoki
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Co.
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SATAKE Hideki
ULSI Research Laboratories, TOSHIBA Corporation
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YASUDA Naoki
ULSI Research Laboratories, TOSHIBA Corporation
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KOGA Junji
Advanced LSI Technology Laboratory, Research and Development Center, Toshiba Corporation
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KOGA Junji
ULSI Research laboratories, Toshiba Corporation
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SATAKE Hideki
MIRAI, Association of Super-Advanced Electronics Technologies (ASET)
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Koga J
Advanced Lsi Technology Laboratory Research And Development Center Toshiba Corporation
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Toriumi Akira
Advanced Lsi Technology Laboratory Research & Development Center Toshiba Co.
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KUNISHIMA Iwao
ULSI Research Laboratories, Toshiba Corporation
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Satake Hideki
Mirai Association Of Super-advanced Electronics Technologies (aset)
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Hayasaka Nobuo
Ulsi Research Center Toshiba Corp.
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Hayasaka Nobuo
Ulsi Research Laboratories Toshiba Corporation
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Kunishima Iwao
Ulsi Research Center Toshiba Corporation
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Satake Hideki
Mirai-aset Aist
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Toriumi Akira
Mirai-advanced Semiconductor Research Center (mirai-asrc) National Institute Of Advanced Industrial
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Koga Junji
ULSI Research Laboratories, Toshiba Corporation,
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SATAKE Hideki
ULSI Research Center, TOSHIBA CORPORATION
著作論文
- Two Correlated Mechanisms in Thin SiO_2 Breakdown
- Observation of Oxide Thickness Dependent Interface Roughness in Si MOS Structure
- Evidence for Asymmetrical Hydrogen Profile in Thin D_2O Oxidized SiO_2 by SIMS and Modified TDS
- Significant Effect of OH inside Silicon Chemical Oxides on AHF(Anhydrous Hydrofluoric Acid) Etching
- Observation of Oxide-Thickness-Dependent Interface Roughness in Si MOS Structure