AC-DC converter based on parallel drive of two piezoelectric transformers (Special issue: Ultrasonic electronics)
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
-
山本 正樹
東北大学多元物質科学研究所
-
Inoue Tatsuya
Materials And Components Research Laboratory Components And Devices Research Center Matsushita Elect
-
Inoue Takahito
Electrotechnical Laboratory
関連論文
- 22pZF-5 極紫外FELによる原子・クラスター多重イオン化実験III. : クラスター多重イオン化のレーザー波長・レーザー強度依存性(22pZF 原子・分子,領域1(原子・分子,量子エレクトロニクス,放射線物理))
- 22pZF-4 極紫外FELによる原子・クラスター多重イオン化実験II. : クラスター多重イオン化のサイズ依存性(22pZF 原子・分子,領域1(原子・分子,量子エレクトロニクス,放射線物理))
- 22pZF-3 極紫外FELによる原子・クラスター多重イオン化実験I. : 反跳イオン運動量分光による高次光分布測定(22pZF 原子・分子,領域1(原子・分子,量子エレクトロニクス,放射線物理))
- 反射波面補正のためにイオンミリングした軟 X 線多層膜鏡の評価
- 軟X線多層膜鏡の形状誤差補正のための大面積イオン銃を用いたミリング装置の開発
- 超高精細バイオイメージング用波面補正軟X線多層膜ミラーの開発
- 傾斜エリプソメトリーによる3次元形状計測 (特集 偏光計測)
- 偏光利用による3次元リアルタイム計測法の開発
- 正反射による物体表面の傾斜エリプソメトリー : 精密実時間形状計測への基本概念
- X線ミラー多層膜 (特集欄 ナノテクノロジーにおけるものづくり) -- (真空中で作製するナノ構造)
- 軟X線多層膜光学
- 水晶振動子を用いたバイブロスキャニング法による非導電体の微細形状計測
- バイブロスキャニング法を用いた微細形状測定システムの開発
- バイブロスキャニング法の微細放電加工機への実装検討 : 微細放電加工機上での微細加工形状のオンマシン測定の試み
- 24aC2 偏光解析法による氷結晶粒界での疑似液体層の検出(結晶成長のその場観察II)
- 圧電センサを用いた共振型バイブロスキャン法の開発
- 軟X線多層膜と応用の現状(EUV基盤技術とその応用の現状)
- 31a-YM-6 Ni薄膜のM吸収端におけるファラデー効果
- バイブロスキャン微細穴形状測定装置の開発
- New Ellipsometric Approach to Critical Dimension Metrology Utilizing Form Birefringence Inherent in a Submicron Line-and-Space Pattern
- 薄膜・表面
- 5a-G-1 透過型多層膜を用いた軟X線偏光分光法 I
- 軟 X 線エリプソメトリー
- 軟X線ポラライザーの最前線
- 反射波面補正のためにイオンミリングした軟X線多層膜鏡の評価
- 軟X線顕微鏡用精密多層膜ミラーの開発
- Direct Observation of Cadmium Arachidate Thin Films with Lateral and Normal Molecular Orientations by Superconducting Cryo-Electron Microscopy
- Lattice Images of Langmuir-Blodgett Films of Cadmium Arachidate Obtained by Superconducting Cryo-Electron Microscope
- Microstructure in LB Films of Long-Alkyl Nitroaniline Derivatives : Surfaces, Interfaces and Films
- Nanoscale Evaluation of Structure and Surface Potential of Gated Field Emitters by Scanning Maxwell-Stress Microscope
- Fabrication of Cantilever with Ultrasharp and High-Aspect-Ratio Stylus for Scanning Maxwell-Stress Microscopy
- Dielectric Properties of Pb-Based Perovskite Substituted by Ti for B-site at Microwave Frequencies
- Low-Fire Bismuth-Based Dielectric Ceramics for Microwave Use
- Ultra-Fast Optoelectronic Decision Circuit Using Resonant Tunneling Diodes and a Uni-Traveling-Carrier Photodiode (Special Issue on Integrated Electronics and New System Paradigms)
- A Multilayered Piezoelectric Transformer Operating in the Third Order Longitudinal Mode and Its Application for an Inverter
- High-Power Characteristics of Multilayer Piezoelectric Ceramic Transducers
- Small Multilayer Piezoelectric Transformers with High Power Density : Characteristics of Second and Third-Mode Rosen-Type Transformers
- High Power Transformer Employing Piezoelectric Ceramics
- Finite-element method analysis of low-frequency wideband array composed of disk bender transducers with differential connections (Special issue: Ultrasonic electronics)
- Low-Frequency Sound Source with Dual Bending Radiation Surfaces
- Investigation of Disk Bender Low-Frequency Projector with Dual Radiation Surfaces
- An Optoelectronic Clock Recovery Circuit Using a Resonant Tunneling Diode and a Uni-Traveling-Carrier Photodiode (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- An Optoelectronic Clock Recovery Circuit Using a Resonant Tunneling Diode and a Uni-Traveling-Carrier Photodiode (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- AC-DC converter based on parallel drive of two piezoelectric transformers (Special issue: Ultrasonic electronics)
- Surface Modification of Glassy Carbon by Pulsed Laser Irradiation with Several Wavelengths
- Surface Modification of Glassy Carbon Using Pulsed KrF Excimer Laser(Surfaces, Interfaces, and Films)
- Highly Oriented Graphite Layer Obtaind on WC-Co by Laser Modification : Surfaces, Interfaces, and Films
- Picosecond Pulsed X-Ray Diffraction from a Pulsed Laser Heated Si(111)
- Time-Resolved X-ray Shadowgraphy Experiment of Laser Ablation of Aluminum using Laser-Induced Picosecond Pulsed X-rays
- Smoothing of Si Trench Sidewall Surface by Chemical Dry Etching and Sacrificial Oxidation
- Striations on Si Trench Sidewalls Observed by Atomic Force Microscopy
- Thermal Decompositiom of Ce0_2 in Ultra High Vacuum as a Cause of Polycrystalline Growth of Si Films on Epitaxial Ce0_2/Si
- Low-Temperature Epitaxial Growth of CeO_2(110)/Si(100) Structure by Evaporation under Substrate Bias
- Analysis of Misoriented Crystal Structure by Ion Channeling Observed Using Ion-Induced Secondary Electrons
- Light Emitting Properties of Linear π-Conjugated Poly(arylene)s
- RBS/Channeling Study of the Crystallographic Correlation for Epitaxial CeO_2 on Si
- High-Sensitivity Channeling Analysis of Lattice Disorder Near Surfaces Using Secondary Electrons Induced by Fast Ions
- Characterization of Epitaxially Grown CeO_2(110) Layers on Si by Means of Shadowing Pattern Imaging with Fast Ion Beams
- Superconducting Bi_2Sr_2CaCu_2O_ Single Films Grown on SrTiO_3 Substrate by the Liquid Phase Epitaxial Method
- Preparation of Single Crystals Containing the High-T_c (above 100 K) Phase of a Bi-Sr-Ca-Cu-O Superconductor
- Synthesis and Decomposition of the High-T_c Phase of a Pb-Doped Bi-Sr-Ca-Cu-O Superconductor
- A New Method for Improving the Superconducting Transition Temperature of Platy ErBa_2Cu_3O_ Single Crystals
- Growth of YBa_2Cu_3O_ Single Crystals from the High Temperature Solution
- Growth of (La_Sr_x)_2CuO_ Crystals from High Temperature Solution
- Electrical Characteristics of Metal/Cerium Dioxide/Silicon Structures
- Quantitative Analysis of Oxygen Deficiency in Epitaxial CeO_2 Layers on Siby Detecting ^O Added for Stoichiometry
- Intermediate Amorphous Layer Formation Mechanism at the Interface of Epitaxial CeO_2 Layers and Si Substrates
- 5. Resistance Characteristics of High Speed Hull Form with Air-ship Form Bulb
- Excimer-Type Electroluminescence and Carrier-Transporting Properties of Electron-Accepting π-Conjugated Polymers
- Texture Structure Analysis and Crystalline Quality Improvement of CeO_2(110) Layers Grown on Si(100) Substrates
- Application of Multiple-Image Fourier Transform Spectral Imaging to Measurement of Fast Phenomena
- Compact Spectral Imaging System Using Liquid Crystal for Fast Measurement
- Interferometric Spectral Imaging and Optical Three-Dimensional Fourier Transformation