A Study of Photoacid Structure Dependence on Lithographic Performance in Chemically Amplified Resists
スポンサーリンク
概要
著者
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YOSHINO Hiroshi
Tohoku University
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YOSHINO Hiroshi
Graduate School of Engineering, Tohoku University
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Hashimoto S
Texas Instruments Tsukuba R & D Center Ltd. Ibaraki Jpn
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Itani T
Selete Tsukuba Jpn
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Yoshino H
Graduate School Of Engineering Tohoku University
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Itani T
Semiconductor Leading Edge Technol. Inc. Yokohama Jpn
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