Robust Noise Characteristics in Carbon Nanotube Transistors Based on Stochastic Resonance and Their Summing Networks
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概要
- 論文の詳細を見る
Robust noise characteristics in carbon nanotube field-effect transistors (CNT-FETs) based on stochastic resonance (SR) were demonstrated to detect small signals in noisy environments. When weak pulse trains were applied to a CNT-FET in the subthreshold regime, the correlation coefficient between the input and output signals increased upon adding an appropriate intensity of noise. Offset-voltage dependences were investigated, and moreover, a virtual summing network was formed using CNT-FETs having different offset voltages. The measurement indicated that responses correlated with the input signals were enhanced in a wide range of noise intensity. Therefore, the summing network based on SR is a promising candidate for highly sensitive label-free sensors which are to be utilized in unintentionally noisy environments.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2011-06-25
著者
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Maehashi Kenzo
The Institute Of Scientific And Industrial Research Osaka University
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Ohno Yasuhide
The Institute Of Scientific And Industrial Research Osaka University
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Matsumoto Kazuhiko
The Institute Of Scientific And Industrial Research Osaka University
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Inoue Koichi
The Institute For Solid State Physics University Of Tokyo
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Hakamata Yasufumi
The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan
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Inoue Koichi
The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan
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Matsumoto Kazuhiko
The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan
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