The Effect of Side Traps on Ballistic Transistor in Kondo Regime
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概要
- 論文の詳細を見る
The effect of side traps on current and conductance in ballistic transport is calculated using slave-boson mean field theory, particularly when there are electrodes on both sides of a short channel. The depth of the conductance dip, which is due to destructive interference known as the Fano–Kondo effect, depends on the tunneling coupling between the conducting region and the electrodes. The results imply that ballistic devices are sensitive to trap sites.
- 2007-04-30
著者
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Tanamoto Tetsufumi
Advanced Lsi Technology Laboratory Toshiba Corporation
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Uchida Ken
Advanced LSI laboratory, Corporate R&D Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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Fujita Shinobu
Advanced LSI laboratory, Corporate R&D Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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Tanamoto Tetsufumi
Advanced LSI laboratory, Corporate R&D Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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